Siglent ASP-26: Precision TDR Probe for High-Speed Signal Analysis

Features and Specifications: Siglent ASP-26 Adjustable TDR Probe, 26.5 GHz, 50 Ohm, Single-Ended, ASP Series

Product Overview:

The Siglent ASP-26 Adjustable TDR Probe is a high-performance probe designed for precise time-domain reflectometry (TDR) measurements. With its wide bandwidth of 26.5 GHz and 50 Ohm impedance, it is ideal for characterizing high-speed digital circuits and interconnects.

Features:

Adjustable tip position for precise measurements
Wide bandwidth of 26.5 GHz
50 Ohm impedance
Single-ended configuration
Low reflection coefficient
Excellent signal integrity
Compact and lightweight design

Bandwidth: 26.5 GHz
Impedance: 50 Ohm
Rise Time: <10 ps
Maximum Input Power: +20 dBm
Operating Temperature: 0°C to +50°C
Storage Temperature: -20°C to +70°C

Siglent ASP-26 Adjustable TDR Probe
Calibration Certificate
User Manual

Benefits:

Precise Measurements: The adjustable tip position allows for precise measurements, ensuring accurate characterization of high-speed circuits.
Wide Bandwidth: The 26.5 GHz bandwidth enables the probe to capture fast-rising signals, making it suitable for advanced digital applications.
Excellent Signal Integrity: The low reflection coefficient and excellent signal integrity ensure reliable and accurate measurements.
Compact and Lightweight: The compact and lightweight design makes the probe easy to handle and use in various test environments.

Value to the Customer:

The Siglent ASP-26 Adjustable TDR Probe provides exceptional performance and versatility for TDR measurements. Its wide bandwidth, adjustable tip position, and excellent signal integrity make it an indispensable tool for engineers and technicians working with high-speed digital circuits and interconnects.