RTM3K-54M Digital Oscilloscope: 4CH, 500MHz, MSO, RTM3000 Series

Rohde & Schwarz RTM3K-54M Digital Oscilloscope Package

Product Overview:

The Rohde & Schwarz RTM3K-54M Digital Oscilloscope Package is a comprehensive solution for demanding measurement applications. This package includes the RTM3000 Series oscilloscope, RTM-B245 500MHz bandwidth upgrade, and RTM-B1 Mixed Signal Oscilloscope (MSO) option.

Features and Specifications:

4-channel oscilloscope with 500MHz bandwidth: Capture high-speed signals with exceptional accuracy.
MSO option: Analyze both analog and digital signals simultaneously, providing a complete view of complex systems.
12-bit vertical resolution: Achieve precise measurements with high signal-to-noise ratio.
10 GS/s real-time sampling rate: Capture transient events with confidence.
Deep memory (100 Mpts): Store and analyze large amounts of data for extended signal analysis.
Advanced triggering capabilities: Isolate specific events of interest with precision.
Intuitive user interface: Navigate and operate the oscilloscope effortlessly.

Enhanced signal visibility: Capture and analyze complex signals with ease.
Comprehensive analysis: Combine analog and digital measurements for a complete understanding of system behavior.
High-precision measurements: Obtain accurate and reliable results with 12-bit vertical resolution.
Efficient troubleshooting: Identify and resolve issues quickly with advanced triggering capabilities.
Time-saving: Deep memory and intuitive user interface streamline measurement processes.

Value to the Customer:

The Rohde & Schwarz RTM3K-54M Digital Oscilloscope Package empowers engineers and technicians with a powerful tool for:

Debugging and testing electronic circuits
Analyzing power systems and embedded systems
Characterizing high-speed signals
Troubleshooting complex digital systems
* Performing educational and research applications

By investing in this package, customers gain access to a versatile and high-performance oscilloscope that meets the demands of today’s demanding measurement challenges.